基于STM32的半导体制冷片测试系统
Abstract
Semiconductorrefrigerationchipiswidelyused,everyyearalargenumberof
semiconductorrefrigerationchipintouse,butthesemiconductorrefrigerationchipdevicetest
technologycannotmeetthecurrentneeds,thedomesticdevelopmentofsemiconductor
refrigerationchiptestinstrumenthasmanydefects,andforeignimportsoftestinstrumentsis
expensive,sothecurrenturgentneedtomeettheneedsofdomesticsmallandmedium-sized
manufacturersofsemiconductorrefrigerationchiptestTherefore,thereisanurgentneedforan
instrumenttomeetthetestingneedsofdomesticsmallandmedium-sizedmanufacturersof
semiconductorrefrigerationwafers.
Toaddressthissituation,thispaperdesignsacomprehensiveinspectionandtestingsystem
forsemiconductorrefrigerationwafers,whichmeetstheneedsoftheexistingdomestic
industriallevel,isaffordable,reliableandeasytooperate.
Thispaperfirstlyexplainstheworkingprincipleofthesemiconductorcooler,then
analyzesthedefectsofthetraditionaltestmethod,andproposesanewtestmethodforthe
semiconductorcooleronthebasisofthetraditionaltestmethod,andproposesthesmallcurrent
ACtestmethodandDCtransientmethodfortheresistancevalueRandthesuperiority
coefficientZofthesemiconductorcooler.
ThehardwarepartofthetestsystemmainlyconsistsofSTM32maincontrolcircuit,
powersupplycircuit,ADCacquisitioncircuit,constantcurrentsourcecircuit,DACvoltage
outputcircuit,invertcircuit,temperaturemeasurementcircuitandsignalamplificationcircuit,
andthesimulationofthecircuitafterdesigningthehardwarecircuit;thesoftwa